Document Type

Article

Publication Date

5-6-2005

Abstract

In this paper, we report the transport properties of Cr-doped Ti2O3 thin films. The thin films were grown on a-Al2O3 s012d substrates by pulsed-laser deposition. X-ray diffraction and transmission electron microscopy results show that the films are single corundum phase. All of sCrxTi1−xd2O3 show semiconducting behavior. Without doping, pure Ti2O3 thin films show positive magnetoresistance sMRd of 23% at 2 K. The MR behavior changed dramatically after doping with Cr. Sample sCr0.1Ti0.9d2O3 shows MR=−360% at 2 K. All of the Cr-doped films are ferromagnetic up to room temperature. © 2005 American Institute of Physics.

DOI

10.1063/1.1852855

Comments

Copyright 2005 AIP (American Institute of Physics) Publishing LLC.

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