Document Type

Article

Publication Date

6-1-2004

Abstract

Cr-doped reduced-rutile TiO2 thin films were grown on R-plane sapphire substrates by pulsed-laser deposition. X-ray diffraction and transmission electron microscopy results indicate that the films are single phase and reduced-rutile type. Superconducting quantum interference device magnetometer measurements show the films are ferromagnetic up to 400 K. A large magnetic moment of 2.9 mB per Cr atom is found for 6% Cr-doped reduced films at room temperature, and the saturation magnetization of the films decreases with increasing Cr doping. The temperature dependence of the resistivity shows semiconducting behavior. © 2004 American Institute of Physics.

DOI

10.1063/1.1667806

Comments

Copyright 2004 AIP (American Institute of Physics) Publishing LLC.

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