Document Type

Article

Publication Date

5-15-2003

Abstract

We have investigated FexTi12xO22d (x50.02, 0.06, and 0.08! thin films grown on a-Al2O3 substrates by pulsed-laser deposition. X-ray diffraction results indicate that the films are single phase and of reduced-rutile type. Detailed microstructural observations reveal no measurable magnetic impurities in the films. Vibrating sample magnetometer measurements show the films are ferromagnetic at room temperature with coercivity ranging from 340 to 770 Oe. The temperature dependence of the resistivity shows nearly metallic behavior at room temperature but semiconducting behavior at lower temperatures. The extraordinary Hall effect with coercivities similar to those in magnetic hysteresis curves was observed at room temperature. The carriers are p type with a carrier density of about 1022/cm3. © 2003 American Institute of Physics.

DOI

10.1063/1.1556122

Comments

Copyright 2003 AIP (American Institute of Physics) Publishing LLC.

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